Description

Memory corruption may occur while initiating two IOCTL calls simultaneously to create processes from two different threads.

Classification

CVE ID: CVE-2025-21436

CVSS Base Severity: HIGH

CVSS Base Score: 7.8

CVSS Vector: CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

Affected Products

Vendor: Qualcomm, Inc.

Product: Snapdragon

Exploit Prediction Scoring System (EPSS)

EPSS Score: 0.02% (probability of being exploited)

EPSS Percentile: 2.59% (scored less or equal to compared to others)

EPSS Date: 2025-04-22 (when was this score calculated)

References

https://nvd.nist.gov/vuln/detail/CVE-2025-21436
https://docs.qualcomm.com/product/publicresources/securitybulletin/april-2025-bulletin.html

Timeline