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CVE-2024-43067: Time-of-check Time-of-use (TOCTOU) Race Condition in Camera

7.8 CVSS

Description

Memory corruption occurs during the copying of read data from the EEPROM because the IO configuration is exposed as shared memory.

Classification

CVE ID: CVE-2024-43067

CVSS Base Severity: HIGH

CVSS Base Score: 7.8

CVSS Vector: CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

Problem Types

CWE-367 Time-of-check Time-of-use (TOCTOU) Race Condition

Affected Products

Vendor: Qualcomm, Inc.

Product: Snapdragon

Exploit Prediction Scoring System (EPSS)

EPSS Score: 0.02% (probability of being exploited)

EPSS Percentile: 2.02% (scored less or equal to compared to others)

EPSS Date: 2025-05-06 (when was this score calculated)

References

https://nvd.nist.gov/vuln/detail/CVE-2024-43067
https://docs.qualcomm.com/product/publicresources/securitybulletin/april-2025-bulletin.html

Timeline